Top Accessed Articles shows the most popular papers in certain duration over the world.

Two Top Accessed Articles in IEEE Transactions on Wireless Communications on March 2013:

Ph.D Sungsoo Park's paper, "Cognitive Radio Networks with Energy Harvesting" is ranked 4th,

and Ph.D Seokjung Kim's paper, "Performance Analysis of Opportunistic Relaying Scheme with Outdated Channel Information" is on 22nd.

You are possible to check all lists of the TWC's Top Accessed Articles in following URL:

http://ieeexplore.ieee.org/xpl/topAccessedArticles.jsp?punumber=7693

Congratulations.

Park, Sungsoo; Kim, Hyungjong; Hong, Daesik, "Cognitive Radio Networks with Energy Harvesting," Wireless Communications, IEEE Transactions on , vol.12, no.3, pp.1386,1397, March 2013
doi: 10.1109/TWC.2013.012413.121009
keywords: {Batteries;Cognitive radio;Energy consumption;Radio transmitters;Sensors;Throughput;Cognitive radio network;energy causality;energy harvesting;opportunistic spectrum access;renewable energy},
URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6449254&isnumber=6482467

Seokjung Kim; Sungsoo Park; Daesik Hong, "Performance Analysis of Opportunistic Relaying Scheme with Outdated Channel Information," Wireless Communications, IEEE Transactions on , vol.12, no.2, pp.538,549, February 2013
doi: 10.1109/TWC.2012.122212.111556
keywords: {channel coding;diversity reception;numerical analysis;probability;radio links;relay networks (telecommunication);wireless channels;ASER;CSI;ORS;SNR;arbitrary link signal-to-noise ratio;average symbol error rate;closed-form expression;coding gain;data transmission phasing;diversity order analysis;opportunistic relaying scheme selection;outage probability;outdated channel state information;performance analysis;relay-destination link;source-relay link;Approximation methods;Data communication;Decoding;Encoding;Modulation;Relays;Signal to noise ratio;Opportunistic relaying scheme;average symbol error rate;coding gain;diversity gain;outage probability;outdated channel information},
URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6410085&isnumber=6472806