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reinforcement learning
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partial overlap
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dynamic HetNet
spectrum partitioning
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and 5G networks.
overloading
massive connectivity
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distributed mode
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OTDOA
maximum likelihood method
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Power allocation
non-orthogonal multiple access (NOMA)
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Gosan Noh, Sungmook Lim, Seokwon Lee, and Daesik Hong,"Goodness-of-Fit-based Malicious User Detection in Cooperative Spectrum Sensing", VTC 2012 Fall, Sep. 2012
[IEEE VTC]
조회 121245
Status : | Presented |
---|---|
Date : | 2012-09 |
Title : | Goodness-of-Fit-based Malicious User Detection in Cooperative Spectrum Sensing |
Authors : | Gosan Noh, Sungmook Lim, Seokwon Lee, and Daesik Hong |
Conference : | VTC 2012 Fall |
Abstract : | Cooperative spectrum sensing improves sensing accuracy in primary user detection, but can be threatened by malicious users. Malicious users may try to falsify the sensing result to indicate that the primary user exists even when there is no primary user in order to monopolize the spectrum usage, thereby depriving other users of their spectrum opportunities. To address this, we propose a malicious user detection scheme where the malicious users are identified and cut off from the cooperative sensing process. The proposed scheme exploits the Anderson-Darling (AD) goodness-of-fit technique which tests whether the empirical distribution of the sensing data from each secondary user fits the expected distribution for a malicious user. In addition, we derive false alarm and detection probabilities for when malicious users are cut off by the malicious user detection scheme. Simulation results show that the proposed goodness-of-fit-based malicious user detection significantly improves sensing performance in comparison with conventional outlier detectionbased schemes. |
URL : | http://ieeexplore.ieee.org/xpl/articleDe...er=6399208 |
Download : | http://mirinae.yonsei.ac.kr/?module=file...97e52d1a0d |
Noh, Gosan; Lim, Sungmook; Lee, Seokwon; Hong, Daesik; , "Goodness-of-Fit-Based Malicious User Detection in Cooperative Spectrum Sensing," Vehicular Technology Conference (VTC Fall), 2012 IEEE , vol., no., pp.1-5, 3-6 Sept. 2012
doi: 10.1109/VTCFall.2012.6399208
URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6399208&isnumber=6398863
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